In integrated circuit design, a critical area is a section of a circuit design wherein a particle of a particular size can cause a failure. It measures the sensitivity of the circuit to a reduction in yield. The critical area on a single layer integrated circuit design is given by: where is the area in which a defect of radius will cause a failure, and is the density function of said defect.
Attributes | Values |
---|---|
rdf:type | |
rdfs:label |
|
rdfs:comment |
|
dct:subject | |
Wikipage page ID |
|
Wikipage revision ID |
|
Link from a Wikipage to another Wikipage | |
sameAs | |
dbp:wikiPageUsesTemplate | |
has abstract |
|
prov:wasDerivedFrom | |
page length (characters) of wiki page |
|
foaf:isPrimaryTopicOf | |
is Link from a Wikipage to another Wikipage of | |
is Wikipage redirect of | |
is foaf:primaryTopic of |