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Design for Excellence or Design For Excellence (DfX or DFX), are terms and expansions used interchangeably in the existing literature, where the X in design for X is a variable which can have one of many possible values. In many fields (e.g., very-large-scale integration (VLSI) and nanoelectronics) X may represent several traits or features including: manufacturability, power, variability, cost, yield, or reliability. This gives rise to the terms design for manufacturability (DfM, DFM), design for inspection (DFI), design for variability (DfV), design for cost (DfC). Similarly, other disciplines may associate other traits, attributes, or objectives for X.