About: Device under test

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A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibration checks. This can include a test after repair to establish that the product is performing in accordance with the original product specification.

Attributes	Values
rdfs:label	Device Under Test (de) Device under test (en) テスト対象デバイス (ja) 被测器件 (zh)
rdfs:comment	A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibration checks. This can include a test after repair to establish that the product is performing in accordance with the original product specification. (en) テスト対象デバイス (テストたいしょうデバイス、英: device under test、DUT)とは、継続的な機能試験や較正を行う対象の機器のこと。試験は出荷前に行われることも、出荷後の製品ライフサイクルの後の方、つまり機器が元々の製品仕様に従って機能していることを確認するための、修理後に行われる試験の場合もある。別の呼び方には業界によってさまざまな変種がある。以下は一例。 * DUT (Device under test) - 被試験デバイス、検査対象機、試験中の装置、被試験体、被検体、被測定物、測定対象 * EUT (Equipment under test) - 被試験機器 * UUT (Unit under test) - 被試験ユニット (ja) 被测器件（英語：device under test，DUT）或被测装置，又称在测单元或被测部件（unit under test，UUT），常用於表示正处於测试阶段的工业产品。 (zh) Als Device Under Test (dt.: Prüfling), kurz DUT, wird vor allem in der elektrischen Mess- und Prüftechnik ein zu prüfendes Objekt bezeichnet. Das kann ein isolierter Bereich auf einem Wafer, ein einzelnes Bauteil, eine Baugruppe oder ein komplettes Gerät sein. Welche Funktionen des DUT geprüft werden, ist abhängig von seiner Art, den zu ermittelnden Testparametern oder Messwerten und den zur Verfügung stehenden Prüfmitteln und Messgeräten. (de)
dct:subject	Environmental testing Hardware testing Product testing Semiconductor device fabrication Electronic engineering Automatic test equipment
Wikipage page ID	5102157 (xsd:integer)
Wikipage revision ID	1119285794 (xsd:integer)
Link from a Wikipage to another Wikipage	Bed of nails tester DUT board Test bench Wafer (electronics) Die (integrated circuit) Environmental testing Hardware testing Product testing Semiconductor device fabrication Electronic engineering Zero insertion force Automatic test equipment Automatic test equipment Pogo pin Printed circuit board System under test Product testing Semiconductor curve tracer Packaged part
sameAs	Device under test Device under test Device under test Device under test Device under test Device under test
dbp:wikiPageUsesTemplate	dbt:Reflist dbt:Tech-stub
has abstract	Als Device Under Test (dt.: Prüfling), kurz DUT, wird vor allem in der elektrischen Mess- und Prüftechnik ein zu prüfendes Objekt bezeichnet. Das kann ein isolierter Bereich auf einem Wafer, ein einzelnes Bauteil, eine Baugruppe oder ein komplettes Gerät sein. Welche Funktionen des DUT geprüft werden, ist abhängig von seiner Art, den zu ermittelnden Testparametern oder Messwerten und den zur Verfügung stehenden Prüfmitteln und Messgeräten. Kann auch als Equipment Under Test (EUT) bezeichnet werden, das in Prüfberichten oft gebräuchlicher ist. Ebenso gebräuchlich ist die Bezeichnung Unit Under Test (UUT). (de) A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibration checks. This can include a test after repair to establish that the product is performing in accordance with the original product specification. (en) テスト対象デバイス (テストたいしょうデバイス、英: device under test、DUT)とは、継続的な機能試験や較正を行う対象の機器のこと。試験は出荷前に行われることも、出荷後の製品ライフサイクルの後の方、つまり機器が元々の製品仕様に従って機能していることを確認するための、修理後に行われる試験の場合もある。別の呼び方には業界によってさまざまな変種がある。以下は一例。 * DUT (Device under test) - 被試験デバイス、検査対象機、試験中の装置、被試験体、被検体、被測定物、測定対象 * EUT (Equipment under test) - 被試験機器 * UUT (Unit under test) - 被試験ユニット (ja) 被测器件（英語：device under test，DUT）或被测装置，又称在测单元或被测部件（unit under test，UUT），常用於表示正处於测试阶段的工业产品。 (zh)
gold:hypernym	Term
prov:wasDerivedFrom	wikipedia-en:Device_under_test?oldid=1119285794&ns=0
page length (characters) of wiki page	2825 (xsd:nonNegativeInteger)
foaf:isPrimaryTopicOf	wikipedia-en:Device_under_test
is Link from a Wikipage to another Wikipage of	Bead probe technology Bed of nails tester Scattering parameters Electronic test equipment Electrostatic discharge Signal tracer Current injection technique DUT board ESD simulator Insertion loss LAN eXtensions for Instrumentation Conducted emissions Mass interconnect Network analyzer (electrical) Standard Test Data Format RF switch matrix Contactor Calibration Functional testing (manufacturing) Device Under Test Plot (graphics) Test bench Test engineer Transmission-line pulse DUT Abbreviated Test Language for All Systems Isolation transformer Partial discharge Equipment under test Random test generator Test fixture Test probe LCR meter Bit error rate SystemVerilog Highly accelerated life test Triaxial cable Mobile-device testing Automatic test equipment Pogo pin Human-body model Capacitance Capacitance meter Xilinx ISE System under test Shmoo plot Unit under test IEC 61000-4-2 Slotted line

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