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About: Electrostatic force microscope     Goto   Sponge   NotDistinct   Permalink

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Electrostatic force microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. ("Dynamic" here means that the cantilever is oscillating and does not make contact with the sample). This force arises due to the attraction or repulsion of separated charges. It is a long-range force and can be detected 100 nm or more from the sample.