About: Jacob Savir

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Jacob Savir is a Professor in the Department of Electrical and Computer Engineering at the New Jersey Institute of Technology and an IEEE Fellow. He is credited with developing two approaches to detecting Transition Faults (a type of Fault model) that might occur during the manufacturing of semiconductor chips, viz., the Skewed-Load Transition Test (Launch-off-shift at-speed test) and the Broad-side delay test (Launch on Capture at-speed test).

Attributes	Values
rdf:type	Thing foaf:Person person dul:NaturalPerson Eukaryote Person Human Animal animal eukaryote scientist species schema:Person Scientist
rdfs:label	Jacob Savir (en)
rdfs:comment	Jacob Savir is a Professor in the Department of Electrical and Computer Engineering at the New Jersey Institute of Technology and an IEEE Fellow. He is credited with developing two approaches to detecting Transition Faults (a type of Fault model) that might occur during the manufacturing of semiconductor chips, viz., the Skewed-Load Transition Test (Launch-off-shift at-speed test) and the Broad-side delay test (Launch on Capture at-speed test). (en)
foaf:name	Jacob Savir (en)
foaf:homepage	https://web.njit.edu/~savir/savir.htm
name	Jacob Savir (en)
dcterms:subject	Living people Year of birth missing (living people) American computer scientists Fellow Members of the IEEE Stanford University alumni Israeli emigrants to the United States Technion – Israel Institute of Technology alumni Israeli computer scientists
Wikipage page ID	48940639 (xsd:integer)
Wikipage revision ID	1086425023 (xsd:integer)
Link from a Wikipage to another Wikipage	Design for testing Living people Year of birth missing (living people) Electrical Engineering Stanford University Statistics Fault model American computer scientists Fellow Members of the IEEE Stanford University alumni Technion – Israel Institute of Technology Israeli emigrants to the United States Technion – Israel Institute of Technology alumni Israeli computer scientists IBM IEEE Fellow New Jersey Institute of Technology
Link from a Wikipage to an external page	https://web.njit.edu/~savir/savir.htm
sameAs	Jacob Savir Jacob Savir Jacob Savir
work institutions	New Jersey Institute of Technology
dbp:wikiPageUsesTemplate	dbt:Authority_control dbt:Citation_needed dbt:Orphan dbt:Reflist dbt:Short_description dbt:Infobox_scientist
alma mater	Technion – Israel Institute of Technology Stanford University (en)
image size	192 (xsd:integer)
website	https://web.njit.edu/~savir/savir.htm
has abstract	Jacob Savir is a Professor in the Department of Electrical and Computer Engineering at the New Jersey Institute of Technology and an IEEE Fellow. He is credited with developing two approaches to detecting Transition Faults (a type of Fault model) that might occur during the manufacturing of semiconductor chips, viz., the Skewed-Load Transition Test (Launch-off-shift at-speed test) and the Broad-side delay test (Launch on Capture at-speed test). (en)
prizes	IEEE Fellow (en) (en)
gold:hypernym	Professor
prov:wasDerivedFrom	wikipedia-en:Jacob_Savir?oldid=1086425023&ns=0
page length (characters) of wiki page	2598 (xsd:nonNegativeInteger)
alma mater	Stanford University Technion – Israel Institute of Technology
award	IEEE Fellow
foaf:isPrimaryTopicOf	wikipedia-en:Jacob_Savir
is Link from a Wikipage to another Wikipage of	Edward J. McCluskey
is foaf:primaryTopic of	wikipedia-en:Jacob_Savir

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