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About: Neutron depth profiling     Goto   Sponge   NotDistinct   Permalink

An Entity of Type : yago:Technique105665146, within Data Space : dbpedia.demo.openlinksw.com associated with source document(s)

Type: topical conceptyago:WikicatNeutron-relatedTechniquesyago:Ability105616246yago:Abstraction100002137yago:Cognition100023271yago:Know-how105616786yago:Method105660268yago:PsychologicalFeature100023100yago:Technique105665146 New Facet based on Instances of this Class

Neutron depth profiling (NDP) is a near-surface analysis technique that is commonly used to obtain profiles of concentration as a function of depth for certain technologically important light elements in nearly any substrate. The technique was first proposed by Ziegler et al. to determine the concentration profiles of boron impurities in silicon substrates, and later improved by Biersack and coworkers to much of its existing capabilities.