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Statements

Subject Item
dbr:Atom_probe
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Atomsonde Atom probe Sonde atomique tomographique
rdfs:comment
The atom probe was introduced at the 14th Field Emission Symposium in 1967 by Erwin Wilhelm Müller and J. A. Panitz. It combined a field ion microscope with a mass spectrometer having a single particle detection capability and, for the first time, an instrument could “... determine the nature of one single atom seen on a metal surface and selected from neighboring atoms at the discretion of the observer”. Die Atomsonde ist ein Analysegerät der Materialwissenschaften. Sie ermöglicht die Identifikation der Masse einzelner Atome, die von einer sehr scharfen Spitze aus einem elektrisch leitenden Material mittels abgelöst werden. Ist es möglich, durch Verwendung eines geeigneten Detektors, dreidimensionale Daten vieler Atome zu gewinnen, so bezeichnet man sie auch als tomographische Atomsonde (englisch tomographic atom probe, TAP) oder dreidimensionale Atomsonde (3DAP). Obwohl es auch Atomsonden gibt, die nur eine eindimensionale Analyse erlauben, ist gewöhnlich die tomographische Atomsonde gemeint. La sonde atomique tomographique est un microscope analytique tridimensionnel de haute résolution qui permet d'observer la distribution spatiale des atomes dans un matériau en en connaissant la nature chimique.
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dbp:date
May 2021
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dbo:abstract
Die Atomsonde ist ein Analysegerät der Materialwissenschaften. Sie ermöglicht die Identifikation der Masse einzelner Atome, die von einer sehr scharfen Spitze aus einem elektrisch leitenden Material mittels abgelöst werden. Ist es möglich, durch Verwendung eines geeigneten Detektors, dreidimensionale Daten vieler Atome zu gewinnen, so bezeichnet man sie auch als tomographische Atomsonde (englisch tomographic atom probe, TAP) oder dreidimensionale Atomsonde (3DAP). Obwohl es auch Atomsonden gibt, die nur eine eindimensionale Analyse erlauben, ist gewöhnlich die tomographische Atomsonde gemeint. La sonde atomique tomographique est un microscope analytique tridimensionnel de haute résolution qui permet d'observer la distribution spatiale des atomes dans un matériau en en connaissant la nature chimique. The atom probe was introduced at the 14th Field Emission Symposium in 1967 by Erwin Wilhelm Müller and J. A. Panitz. It combined a field ion microscope with a mass spectrometer having a single particle detection capability and, for the first time, an instrument could “... determine the nature of one single atom seen on a metal surface and selected from neighboring atoms at the discretion of the observer”. Atom probes are unlike conventional optical or electron microscopes, in that the magnification effect comes from the magnification provided by a highly curved electric field, rather than by the manipulation of radiation paths. The method is destructive in nature removing ions from a sample surface in order to image and identify them, generating magnifications sufficient to observe individual atoms as they are removed from the sample surface. Through coupling of this magnification method with time of flight mass spectrometry, ions evaporated by application of electric pulses can have their mass-to-charge ratio computed. Through successive evaporation of material, layers of atoms are removed from a specimen, allowing for probing not only of the surface, but also through the material itself. Computer methods are used to rebuild a three-dimensional view of the sample, prior to it being evaporated, providing atomic scale information on the structure of a sample, as well as providing the type atomic species information. The instrument allows the three-dimensional reconstruction of up to billions of atoms from a sharp tip (corresponding to specimen volumes of 10,000-10,000,000 nm3).
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