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Statements

Subject Item
dbr:Critical_area_(computing)
rdf:type
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rdfs:label
Critical area (computing)
rdfs:comment
In integrated circuit design, a critical area is a section of a circuit design wherein a particle of a particular size can cause a failure. It measures the sensitivity of the circuit to a reduction in yield. The critical area on a single layer integrated circuit design is given by: where is the area in which a defect of radius will cause a failure, and is the density function of said defect.
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dbc:Integrated_circuits
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1110862799
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dbr:Integrated_circuit dbc:Integrated_circuits dbr:Design_for_manufacturability_(IC)
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In integrated circuit design, a critical area is a section of a circuit design wherein a particle of a particular size can cause a failure. It measures the sensitivity of the circuit to a reduction in yield. The critical area on a single layer integrated circuit design is given by: where is the area in which a defect of radius will cause a failure, and is the density function of said defect.
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wikipedia-en:Critical_area_(computing)